S. Shah

Reliability analysis of disk drive failure mechanisms

S. Shah, J.G. Elerath, 2005, Annual Reliability and Maintainability Symposium, 2005. Proceedings..

Disk drive vintage and its effect on reliability

S. Shah, J.G. Elerath, 2004, Annual Symposium Reliability and Maintainability, 2004 - RAMS.

Test chip characterization of X architecture diagonal lines for SoC design

S. Shah, H. Brut, J.P. Schoellkopf, 2004, Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516).

Server class disk drives: how reliable are they?

S. Shah, J.G. Elerath, 2004, Annual Symposium Reliability and Maintainability, 2004 - RAMS.

Test chip for inductance characterization and modeling for sub-100nm X architecture and Manhattan chip design

Li Song, S. Shah, N.D. Arora, 2005, Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..