Z. Koren

A Unified Approach to Yield Analysis of Defect Tolerant Circuits

I. Koren, Z. Koren, 1990 .

A self-correcting active pixel sensor using hardware and software correction

Y. Audet, G.H. Chapman, I. Koren, 2004, IEEE Design & Test of Computers.

Defect tolerance in VLSI circuits: techniques and yield analysis

Israel Koren, Z. Koren, I. Koren, 1998, Proc. IEEE.

On gracefully degrading multiprocessors with multistage interconnection networks

I. Koren, Z. Koren, 1989 .