Joe Varghese

Effect of geometric complexities and nonlinear material properties on interfacial crack behavior in electronic devices

Koustav Sinha, Joe Varghese, Abhijit Dasgupta, 2014, Microelectron. Reliab..

Test methodology for durability estimation of surface mount interconnects under drop testing conditions

Joe Varghese, Abhijit Dasgupta, 2007, Microelectron. Reliab..