A. R. Duncan

Testing the Tester: Lessons Learned During the Testing of a State-of-the-Art Commercial 14nm Processor Under Proton Irradiation

K. A. LaBel, C. M. Szabo, A. R. Duncan, 2017, 2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

Impact of Neutron-Induced Displacement Damage on the Multiple Bit Upset Sensitivity of a Bulk CMOS SRAM

A. R. Duncan, M. W. Savage, J. D. Ingalls, 2012, IEEE Transactions on Nuclear Science.

Effect of Accumulated Charge on the Total Ionizing Dose Response of a NAND Flash Memory

T. R. Oldham, A. R. Duncan, M. J. Gadlage, 2012, IEEE Transactions on Nuclear Science.