S. Miyano

Self-improvement of cell stability in SRAM by post fabrication technique

A. Kumar, T. Saraya, S. Miyano, 2012, 2012 IEEE Silicon Nanoelectronics Workshop (SNW).

Direct measurements, analysis, and post-fabrication improvement of noise margins in SRAM cells utilizing DMA SRAM TEG

S. Miyano, M. Suzuki, K. Takeuchi, 2010, 2010 Symposium on VLSI Technology.