Juli Blasco

发表

Single-parameter model for the post-breakdown conduction characteristics of HoTiOx-based MIM capacitors

Jordi Suñé, Héctor García, Enrique Miranda, 2014, Microelectron. Reliab..

Equivalent circuit modeling of the bistable conduction characteristics in electroformed thin dielectric films

Jordi Suñé, Nestor Fabian Ghenzi, Enrique Miranda, 2015, Microelectron. Reliab..

Modeling of the Hysteretic $I{-}V$ Characteristics of ${\rm TiO}_{2}$-Based Resistive Switches Using the Generalized Diode Equation

Enrique Miranda, Juli Blasco, Pablo Levy, 2014, IEEE Electron Device Letters.