Rod Byrne

BIST generators for sequential faults

D. Michael Miller, Shujian Zhang, Rod Byrne, 1992, Proceedings 1992 IEEE International Conference on Computer Design: VLSI in Computers & Processors.

Why cellular automata are better than LFSRs as built-in self-test generators for sequential-type faults

D. Michael Miller, Shujian Zhang, Jon C. Muzio, 1994, Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94.

Quantitative analysis for linear hybrid cellular automata and LFSR as built-in self-test generators for sequential faults

D. Michael Miller, Shujian Zhang, Jon C. Muzio, 1995, J. Electron. Test..

Phon 1.2: A Computational Basis for Phonological Database Elaboration and Model Testing

Todd Wareham, Brian MacWhinney, Gregory Hedlund, 2007 .

Phon: A Computational Basis for Phonological Database Building and Model Testing

Todd Wareham, Brian MacWhinney, Yvan Rose, 2013, Cognitive Aspects of Computational Language Acquisition.