Shiuh-Wuu Lee

发表

New insights into the design for end-of-life variability of NBTI in scaled high-κ/metal-gate Technology for the nano-reliability era

Ru Huang, Jinhua Liu, Runsheng Wang, 2014, 2014 IEEE International Electron Devices Meeting.

New understanding of state-loss in complex RTN: Statistical experimental study, trap interaction models, and impact on circuits

Ru Huang, Shaofeng Yu, Yangyuan Wang, 2014, 2014 IEEE International Electron Devices Meeting.

First foundry platform of complementary tunnel-FETs in CMOS baseline technology for ultralow-power IoT applications: Manufacturability, variability and technology roadmap

Ru Huang, Hao Zhu, Jiaxin Wang, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

A compact IGFET model-ASIM

Shiuh-Wuu Lee, Robert C. Rennick, R. C. Rennick, 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Adding the missing time-dependent layout dependency into device-circuit-layout co-optimization - New findings on the layout dependent aging effects

Ru Huang, Shaofeng Yu, David Z. Pan, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

A proposed method for determining a MOSFET gate electrode's bottom dimension and the on-state fringing capacitance

Shiuh-Wuu Lee, 1993, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

A unified approach for trap-aware device/circuit co-design in nanoscale CMOS technology

Ru Huang, Yangyuan Wang, Runsheng Wang, 2013, 2013 IEEE International Electron Devices Meeting.

Deep understanding of AC RTN in MuGFETs through new characterization method and impacts on logic circuits

Ru Huang, Shaofeng Yu, Yangyuan Wang, 2013, 2013 Symposium on VLSI Technology.

Universality of mobility-gate field characteristics of electrons in the inversion charge layer and its application in MOSFET modeling

Shiuh-Wuu Lee, 1989, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

New insights into AC RTN in scaled high-к / metal-gate MOSFETs under digital circuit operations

Ru Huang, Shaofeng Yu, Yangyuan Wang, 2012, 2012 Symposium on VLSI Technology (VLSIT).