Cyrille Beltrando

Highs and lows of radiation testing

Dan Alexandrescu, Anne-Lise Lhomme-Perrot, Erwin Schäfer, 2009, 2009 15th IEEE International On-Line Testing Symposium.

Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node

Shi-Jie Wen, Erwin Schäfer, Cyrille Beltrando, 2008, 2008 14th IEEE International On-Line Testing Symposium.