R. Rodriguez
发表
F. Campabadal,
M. Maestro,
J. Diaz,
2015,
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon.
A. Rubio,
A. Crespo-Yepes,
J. Martin-Martinez,
2013,
2013 IEEE International Reliability Physics Symposium (IRPS).
F. Campabadal,
M. Maestro,
A. Crespo-Yepes,
2016,
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
R. Rodriguez,
X. Aymerich,
R. Fernandez,
2005,
SPIE Microtechnologies.
G. Groeseneken,
R. Degraeve,
B. Kaczer,
2012,
IEEE Transactions on Device and Materials Reliability.
X. Aragones,
D. Mateo,
E. Roca,
2017,
2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
G. Groeseneken,
B. Kaczer,
J. Martin-Martinez,
2008,
ESSDERC 2008 - 38th European Solid-State Device Research Conference.
X. Aragones,
D. Mateo,
R. Rodriguez,
2017,
2017 International Conference of Microelectronic Test Structures (ICMTS).
J. Martin-Martinez,
R. Rodriguez,
M. Nafria,
2012,
2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology.
G. Groeseneken,
B. Kaczer,
B. Dierickx,
2009,
2009 Spanish Conference on Electron Devices.
F. Gamiz,
J. Martin-Martinez,
R. Rodriguez,
2014,
2014 5th European Workshop on CMOS Variability (VARI).
R. Rodriguez,
M. Nafria,
M. Pedro,
2018,
2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).
D. Ielmini,
M. Maestro,
R. Rodriguez,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
J. Martin-Martinez,
R. Rodriguez,
M. Nafria,
2012,
2012 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD).
J. Martin-Martinez,
R. Rodriguez,
M. Nafria,
2011,
2011 International Electron Devices Meeting.
E. Roca,
J. Martin-Martinez,
R. Rodriguez,
2014,
2014 5th European Workshop on CMOS Variability (VARI).
Time-Dependent Variability Related to BTI Effects in MOSFETs: Impact on CMOS Differential Amplifiers
J. Martin-Martinez,
R. Rodriguez,
M. Nafria,
2009,
IEEE Transactions on Device and Materials Reliability.