D. T. Hurley

Emission microscopy locates chip-level defects : Optoelectronics World : Packaging

D. T. Hurley, 1999 .

Dynamics of backside wafer level microprobing

D. T. Hurley, C.-L. Chiang, 1998, 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).