Yi-Sun Chung

Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs

Sung-Kyu Kwon, Hi-Deok Lee, Ho-Young Kwak, 2013, IEICE Trans. Electron..

A novel BJT structure for high- performance analog circuit applications

Sung-Kyu Kwon, Jae-Nam Yu, Hi-Deok Lee, 2013, 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS).

Novel BJT test structure for high-performance matching characteristics in CMOS-based analog applications

Hi-Deok Lee, Sang-Uk Park, Jung-Hwan Lee, 2011, 2011 IEEE ICMTS International Conference on Microelectronic Test Structures.

Novel PNP BJT Structure to Improve Matching Characteristics for Analog and Mixed Signal Integrated Circuit Applications

Sung-Kyu Kwon, Hi-Deok Lee, Ho-Young Kwak, 2013, IEICE Trans. Electron..

Characterization of Random Telegraph Signal Noise of High-Performance p-MOSFETs With a High-$k$ Dielectric/Metal Gate

Chang Yong Kang, Sang-Uk Park, Ga-Won Lee, 2011, IEEE Electron Device Letters.

A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications

Sung-Kyu Kwon, Jae-Hyung Jang, Hyuk-Min Kwon, 2012, IEEE Transactions on Semiconductor Manufacturing.

Effect of Nitrogen Concentration on Low-Frequency Noise and Negative Bias Temperature Instability of p-Channel Metal-Oxide-Semiconductor Field-Effect Transistors with Nitrided Gate Oxide

Sung-Kyu Kwon, Ga-Won Lee, Min-Gyu Lim, 2011 .