T. M. Mak
发表
Cecilia Metra,
Martin Omaña,
T. M. Mak,
2011,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Cecilia Metra,
Martin Omaña,
T. M. Mak,
2004,
2004 International Conferce on Test.
Qiang Xu,
Krishnendu Chakrabarty,
Li Jiang,
2009,
2009 IEEE/ACM International Conference on Computer-Aided Design - Digest of Technical Papers.
T. M. Mak,
2006,
12th IEEE International On-Line Testing Symposium (IOLTS'06).
Cecilia Metra,
Bruno Riccò,
T. M. Mak,
2001,
Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.
Cecilia Metra,
T. M. Mak,
Stefano Di Francescantonio,
2004,
IEEE Transactions on Computers.
Qiang Xu,
Krishnendu Chakrabarty,
Li Jiang,
2012,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Subhasish Mitra,
T. M. Mak,
2006,
IOLTS.
Kwang-Ting Cheng,
T. M. Mak,
Kaushik Roy,
2003
.
Cecilia Metra,
Martin Omaña,
Daniele Rossi,
2006,
2006 IEEE Design and Diagnostics of Electronic Circuits and systems.
Shahin Nazarian,
T. M. Mak,
Arani Sinha,
2006,
2006 13th IEEE International Conference on Electronics, Circuits and Systems.
Abhijit Chatterjee,
Adit D. Singh,
Vivek De,
2006,
19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06).
Cecilia Metra,
Daniele Rossi,
T. M. Mak,
2003,
Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI Systems.
Vishwanath Natarajan,
Shreyas Sen,
Sule Ozev,
2017,
ACM Trans. Design Autom. Electr. Syst..
Sandip Kundu,
T. M. Mak,
Rajesh Galivanche,
2004,
2004 International Conferce on Test.
Nur A. Touba,
Joon-Sung Yang,
T. M. Mak,
2009,
2009 International Test Conference.
Ming Zhang,
James Tschanz,
T. M. Mak,
2007,
13th IEEE International On-Line Testing Symposium (IOLTS 2007).
John Kim,
Wolfgang Meyer,
Amitava Majumdar,
2014,
2014 IEEE 32nd VLSI Test Symposium (VTS).
T. M. Mak,
Michael Spica,
M. Spica,
2004,
Records of the 2004 International Workshop on Memory Technology, Design and Testing, 2004..
Sandip Kundu,
T. M. Mak,
Rajesh Galivanche,
2004
.
Cecilia Metra,
Martin Omaña,
T. M. Mak,
2004,
CF '04.
Cecilia Metra,
Martin Omaña,
T. M. Mak,
2012,
IEEE Transactions on Computers.
Srikanth Venkataraman,
T. M. Mak,
S. Venkataraman,
2008
.
Kwang-Ting Cheng,
Angela Krstic,
Li-C. Wang,
2004,
IEEE Design & Test of Computers.
T. M. Mak,
2007,
13th IEEE International On-Line Testing Symposium (IOLTS 2007).
T. M. Mak,
2006,
IEEE Des. Test Comput..
Ming Zhang,
Subhasish Mitra,
T. M. Mak,
2005,
11th IEEE International On-Line Testing Symposium.
Kaushik Roy,
Kwang-Ting Cheng,
T. M. Mak,
2006,
IEEE Design & Test of Computers.
Cecilia Metra,
Martin Omaña,
T. M. Mak,
2007,
2007 IEEE International Test Conference.
Cecilia Metra,
Martin Omaña,
T. M. Mak,
2008,
2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems.
Li-C. Wang,
T. M. Mak,
Leonard Lee,
2005,
23rd IEEE VLSI Test Symposium (VTS'05).
Dong Sam Ha,
T. M. Mak,
Rajesh Thirugnanam,
2007,
IEEE Computer Society Annual Symposium on VLSI (ISVLSI '07).
Kewal K. Saluja,
T. M. Mak,
Eric F. Weglarz,
2004,
Proceedings. 10th IEEE International On-Line Testing Symposium.
Kwang-Ting Cheng,
Li-C. Wang,
T. M. Mak,
2004,
ICCAD 2004.
T. M. Mak,
Mike Tripp,
Anne Meixner,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Shreyas Sen,
Sule Ozev,
T. M. Mak,
2013,
2013 IEEE 31st VLSI Test Symposium (VTS).
Cecilia Metra,
Martin Omaña,
Daniele Rossi,
2015,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Cecilia Metra,
Martin Omaña,
Daniele Rossi,
2006,
12th IEEE International On-Line Testing Symposium (IOLTS'06).
T. M. Mak,
Mike Tripp,
Anne Meixner,
2004,
2004 International Conferce on Test.
Naresh R. Shanbhag,
Ming Zhang,
Quan Shi,
2006,
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Cecilia Metra,
Martin Omaña,
T. M. Mak,
2004,
Proceedings Design, Automation and Test in Europe Conference and Exhibition.
Kwang-Ting Cheng,
T. M. Mak,
Mike Peng Li,
2008
.
T. M. Mak,
2008,
2008 IEEE International Test Conference.
Ming Zhang,
Subhasish Mitra,
T. M. Mak,
2005,
IEEE International Conference on Test, 2005..
Kaushik Roy,
Kwang-Ting Cheng,
T. M. Mak,
2003,
Proceedings. 21st VLSI Test Symposium, 2003..
T. M. Mak,
M. Spica,
2004
.
Cecilia Metra,
Martin Omaña,
Daniele Giaffreda,
2010,
2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems.
Melvin A. Breuer,
Sandeep K. Gupta,
T. M. Mak,
2004,
IEEE Design & Test of Computers.
Kwang-Ting Cheng,
Angela Krstic,
Li-C. Wang,
2003,
Proceedings 2003. Design Automation Conference (IEEE Cat. No.03CH37451).
Kwang-Ting Cheng,
Angela Krstic,
Li-C. Wang,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
T. M. Mak,
Mike Tripp,
Anne Meixner,
2004,
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference (IEEE Cat. No.04CH37571).
T. M. Mak,
Mehrdad Nourani,
Laung Terng Wang,
2008
.
Kwang-Ting Cheng,
Magdy S. Abadir,
Li-C. Wang,
2004,
Proceedings. 41st Design Automation Conference, 2004..
Cecilia Metra,
Martin Omaña,
Daniele Rossi,
2014,
J. Electron. Test..
Neil G. Jacobson,
T. M. Mak,
Louis Y. Ungar,
2020
.
T. M. Mak,
Mike Tripp,
A. Meixner,
2003
.
Cecilia Metra,
Martin Omaña,
Daniele Rossi,
2005,
20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05).
F. Joel Ferguson,
T. M. Mak,
Debika Bhattacharya,
1998,
Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
Sani R. Nassif,
T. M. Mak,
2006,
IEEE Design & Test of Computers.
Ming Zhang,
Subhasish Mitra,
T. M. Mak,
2006,
2006 IFIP International Conference on Very Large Scale Integration.
Cecilia Metra,
Martin Omaña,
T. M. Mak,
2007,
25th IEEE VLSI Test Symposium (VTS'07).
T. M. Mak,
Mike Tripp,
Anne Meixner,
2004,
IEEE Design & Test of Computers.
T. M. Mak,
2007,
IEEE Des. Test Comput..
T. M. Mak,
2014,
ITC.
T. M. Mak,
Louis Y. Ungar,
Neil Glenn Jacobson,
2020,
IEEE Instrumentation & Measurement Magazine.
Cecilia Metra,
T. M. Mak,
Stefano Di Francescantonio,
2002,
Proceedings. International Test Conference.
Melvin A. Breuer,
Sandeep K. Gupta,
Liang-Chi Chen,
2001,
Proceedings International Test Conference 2001 (Cat. No.01CH37260).
Cecilia Metra,
Daniele Rossi,
T. M. Mak,
2007,
IEEE Transactions on Computers.
T. M. Mak,
2005,
11th IEEE International On-Line Testing Symposium.
T. M. Mak,
2005,
14th Asian Test Symposium (ATS'05).
Kwang-Ting Cheng,
Li-C. Wang,
T. M. Mak,
2004,
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004..
Sandip Kundu,
T. M. Mak,
Rajesh Galivanche,
2004,
2004 International Conferce on Test.
T. M. Mak,
M. Omaña,
C. Metra,
2004,
2004 International Conferce on Test.
T. M. Mak,
M. Omaña,
C. Metra,
2004
.
R. Thirugnanam,
Dong Sam Ha,
T.M. Mak,
2008,
2008 4th IEEE International Conference on Circuits and Systems for Communications.
R. Thirugnanam,
Dong Sam Ha,
T.M. Mak,
2007,
2007 IEEE International Symposium on Power Line Communications and Its Applications.