Reza Pazirandeh

Determination of GaN HEMT reliability by monitoring IDSS

Günther Tränkle, Joachim Würfl, Reza Pazirandeh, 2010, Microelectron. Reliab..

Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures

Christian Boit, Piotr Laskowski, Günther Tränkle, 2009, Microelectron. Reliab..

Influence of GaN cap on robustness of AlGaN/GaN HEMTs

Christian Boit, Joachim Wurfl, Arkadiusz Glowacki, 2009, 2009 IEEE International Reliability Physics Symposium.