Ching-Wei Tsai

Mechanism for slow switching effect in advanced low-voltage, high-speed Pb(Zr/sub 1-x/Ti/sub x/)O/sub 3/ ferroelectric memory

Ching-Wei Tsai, Sheng-Chih Lai, C.T. Yen, 2005, IEEE Transactions on Device and Materials Reliability.

A novel transient characterization technique to investigate trap properties in HfSiON gate dielectric MOSFETs-from single electron emission to PBTI recovery transient

Ching-Wei Tsai, Tahui Wang, D. Tang, 2006, IEEE Transactions on Electron Devices.