Z. Yonezawa

Development of an objective flat-field spectrograph for electron microscopic soft x-ray emission spectrometry in 50-4000 eV

T. Imazono, M. Koike, T. Kawachi, 2013, Optics & Photonics - Optical Engineering + Applications.

Diffraction efficiencies of holographic laminar and blazed types gratings for use in a flat-field spectrograph in the 50-200 eV range for transmission electron microscopes

Kazuo Sano, Y. Oue, Z. Yonezawa, 2011, Optical Engineering + Applications.

Development of a soft x-ray diffractometer for a wideband multilayer grating with a novel layer structure in the 2-4 keV range

Y. Oue, Z. Yonezawa, Noboru Hasegawa, 2012 .

Ultrasoft-X-ray emission spectroscopy using a newly designed wavelength-dispersive spectrometer attached to a transmission electron microscope

Y. Oue, Z. Yonezawa, Tetsuya Kawachi, 2012 .

A multilayer grating with a novel layer structure for a flat-field spectrograph attached to transmission electron microscopes in energy region of 2-4 keV

Y. Oue, Z. Yonezawa, Nobuo Handa, 2012 .