Nicolas J.-H Roche

Measurement and Analysis of Multiple Output Transient Propagation in BJT Analog Circuits

D. McMorrow, S. P. Buchner, J. H. Warner, 2015, 2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS).

An Investigation of Single-Event Effect Modeling Techniques for a SiGe RF Low-Noise Amplifier

John D. Cressler, Jeffrey H. Warner, Adrian Ildefonso, 2016, IEEE Transactions on Nuclear Science.

On the Transient Response of a Complementary (npn $+$ pnp) SiGe HBT BiCMOS Technology

Mehmet Kaynak, John D. Cressler, Jeffrey H. Warner, 2014, IEEE Transactions on Nuclear Science.

An Investigation of Single Event Transient Response in 45-nm and 32-nm SOI RF-CMOS Devices and Circuits

John D. Cressler, Zachary E. Fleetwood, Nelson E. Lourenco, 2013, IEEE Transactions on Nuclear Science.

Single-Event Transient and Total Dose Response of Precision Voltage Reference Circuits Designed in a 90-nm SiGe BiCMOS Technology

Laleh Najafizadeh, John D. Cressler, En Xia Zhang, 2014, IEEE Transactions on Nuclear Science.

A Dosimetry Methodology for Two-Photon Absorption Induced Single-Event Effects Measurements

Jeffrey H. Warner, Joseph S. Melinger, Ani Khachatrian, 2014, IEEE Transactions on Nuclear Science.

Simulation of Laser-Based Two-Photon Absorption Induced Charge Carrier Generation in Silicon

Ani Khachatrian, Joel M. Hales, Dale McMorrow, 2015, IEEE Transactions on Nuclear Science.

Single-Event Effects in a W-Band (75-110 GHz) Radar Down-Conversion Mixer Implemented in 90 nm, 300 GHz SiGe HBT Technology

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2015, IEEE Transactions on Nuclear Science.

Two-Photon Absorption Induced Single-Event Effects: Correlation Between Experiment and Simulation

Nicholas C. Hooten, En Xia Zhang, Ronald D. Schrimpf, 2015, IEEE Transactions on Nuclear Science.

An Investigation of Single-Event Transients in C-SiGe HBT on SOI Current Mirror Circuits

John D. Cressler, Jeffrey H. Warner, Ickhyun Song, 2014, IEEE Transactions on Nuclear Science.

Single-Event Upsets in Substrate-Etched CMOS SOI SRAMs Using Ultraviolet Optical Pulses With Sub-Micrometer Spot Size

Jeffrey H. Warner, Vincent Pouget, Joseph S. Melinger, 2013, IEEE Transactions on Nuclear Science.