Regis Vanderhaghen

Ultrafast thermal nonlinearities in amorphous silicon

Philippe M. Fauchet, Daniele Hulin, A. Mourchid, 1992, Other Conferences.

Low-temperature plasma-deposited microcrystalline silicon thin films: an emerging material for stable thin film transistors

Regis Vanderhaghen, Pere Roca i Cabarrocas, Samir Kasouit, 2003, IS&T/SPIE Electronic Imaging.

Noninvasive electrical characterization of semiconductor at bulk and interfaces

Regis Vanderhaghen, Bernard Drevillon, Virginia Chu, 2003, SPIE OPTO.

Modulated photoellipsometry measurements of GaAs internal field

Regis Vanderhaghen, Bernard Drevillon, Razvigor Ossikovski, 1995, Photonics West.

Noninvasive electrical characterization of semiconductor and interface

Regis Vanderhaghen, Bernard Drevillon, Samir Kasouit, 2002, SPIE OPTO.

Stable microcrystalline silicon thin-film transistors produced by the layer-by-layer technique

Regis Vanderhaghen, Romain Brenot, Bernard Drevillon, 1999 .

In situ investigation of polymorphous silicon deposition

Regis Vanderhaghen, Romain Brenot, P. Roca i Cabarrocas, 2000 .