K. L. Young

Measuring Exposure to Driver Distraction

John D. Lee, Mark Stevenson, Michael Arthur Regan, 2009 .

The changing role and future challenges of quality and reliability in the foundry industry

J. T. Yue, K. L. Young, D.H.-I. Su, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).

Epidemiological Research on Driver Distraction

John D. Lee, Mark Stevenson, Michael Arthur Regan, 2009 .