N. J. Smeenk

Steps to minimize the characterization errors in steady state IV curve measurements taken with C.O.T.S. equipment

J. J. Schermer, G. J. Bauhuis, E. J. Haverkamp, 2011, 2011 37th IEEE Photovoltaic Specialists Conference.

Exploiting anisotropy for in situ measurement of silicon etch rates in KOH solution

N. J. Smeenk, H. Philipsen, J. Kelly, 2006 .

Arsenic Formation on GaAs during Etching in HF Solutions: Relevance for the Epitaxial Lift-Off Process

N. J. Smeenk, J. Schermer, P. Mulder, 2013 .

Space environmental testing of flexible coverglass alternatives based on siloxanes

N. J. Smeenk, J. Schermer, P. Mulder, 2013 .

Flexible shielding layers for solar cells in space applications

N. J. Smeenk, J. Schermer, P. Mulder, 2016 .

A genuine circular contact grid pattern for solar cells

N. J. Smeenk, J. Schermer, E. Haverkamp, 2011 .

A new circular contact grid pattern, designed for solar cells in a mechanical stack

N. J. Smeenk, J. Schermer, E. Haverkamp, 2010, 2010 35th IEEE Photovoltaic Specialists Conference.