N. M. Iyer

发表

Xiaoping Wang, Jiang Hao, Zhang Guowei, 2011, IEEE Transactions on Device and Materials Reliability.

N. M. Iyer, Haojun Zhang, Jian-Hsing Lee, 2016, 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

N. M. Iyer, Jian-Hsing Lee, T. Tsai, 2017, 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

Natarajan Mahadeva Iyer, Mirko Scholz, Dimitri Linten, 2006 .

Natarajan Mahadeva Iyer, Dimitri Linten, Steven Thijs, 2005 .

N. M. Iyer, Haojun Zhang, Jian-Hsing Lee, 2017, IEEE Electron Devices Technology and Manufacturing Conference.

Anil Kumar, Jagar Singh, Eller Manfred, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

Jian-Hsing Lee, Natarajan Mahadeva Iyer, Timothy J. Maloney, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Jian-Hsing Lee, Natarajan Mahadeva Iyer, Manjunatha Prabhu, 2016, 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).

M. Kuijk, N.M. Iyer, J. Craninckx, 2005, IEEE Transactions on Microwave Theory and Techniques.