N. M. Iyer
发表
Xiaoping Wang,
Jiang Hao,
Zhang Guowei,
2011,
IEEE Transactions on Device and Materials Reliability.
N. M. Iyer,
Haojun Zhang,
Jian-Hsing Lee,
2016,
2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
N. M. Iyer,
Jian-Hsing Lee,
T. Tsai,
2017,
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
Natarajan Mahadeva Iyer,
Mirko Scholz,
Dimitri Linten,
2006
.
Natarajan Mahadeva Iyer,
Dimitri Linten,
Steven Thijs,
2005
.
N. M. Iyer,
Haojun Zhang,
Jian-Hsing Lee,
2017,
IEEE Electron Devices Technology and Manufacturing Conference.
Anil Kumar,
Jagar Singh,
Eller Manfred,
2014,
2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.
Jian-Hsing Lee,
Natarajan Mahadeva Iyer,
Timothy J. Maloney,
2019,
2019 IEEE International Reliability Physics Symposium (IRPS).
Jian-Hsing Lee,
Natarajan Mahadeva Iyer,
Manjunatha Prabhu,
2016,
2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).
M. Kuijk,
N.M. Iyer,
J. Craninckx,
2005,
IEEE Transactions on Microwave Theory and Techniques.