Joseph A. Dura

The Center for Research on Extreme Batteries | NIST

Esther S. Takeuchi, Kang Xu, Eric D. Wachsman, 2016 .

Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study

Yasushi Azuma, Noboru Suzuki, Deane Chandler-Horowitz, 2004 .

Neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry characterization of thin SiO2 on Si

Charles F. Majkrzak, Curt A. Richter, Nhan V. Nguyen, 1998 .

Solid Electrolyte Interphase in Li-Ion Batteries: Evolving Structures Measured In situ by Neutron Reflectometry

Jon P. Owejan, Steven C. DeCaluwe, Joseph A. Dura, 2012 .

Porous Mg formation upon dehydrogenation of MgH2 thin films

Bruce M. Clemens, Charles F. Majkrzak, Paul A. Kienzle, 2011 .

Phase determination and inversion in specular neutron reflectometry

R. D. Deslattes, Alamgir Karim, C. F. Majkrzak, 1998 .