H. Dallaporta

Commande à structure variable d'un actionneur piézoélectrique associé à un microscope à effet tunnel

N. Bonnail, D. Tonneau, F. Jandard, 2003 .

Ultimate lithography using proximal probes for single electron device fabrication or nano-object addressing

D. Tonneau, H. Dallaporta, N. Clement, 2003, 2003 International Semiconductor Conference. CAS 2003 Proceedings (IEEE Cat. No.03TH8676).

Resistless patterning of quantum nanostructures by local anodization with an atomic force microscope

D. Tonneau, J. Gautier, Marc Faucher, 2002 .

Electronic transport properties of single-crystal silicon nanowires fabricated using an atomic force microscope

D. Tonneau, J. Gautier, H. Dallaporta, 2002 .

Direct patterning of nanostructures by field-induced deposition from a scanning tunneling microscope tip

D. Tonneau, A. Houel, N. Bonnail, 2002 .

STM studies: spatial resolution limits to fit observations in nanotechnology

D. Tonneau, Florence Marchi, Margrit Hanbücken, 2000 .

Proximal Probe Induced Chemical Processing for Nanodevice Elaboration

D. Tonneau, A. Houel, N. Bonnail, 2002 .

Direct patterning of noble metal nanostructures with a scanning tunneling microscope

R. Even, D. Tonneau, H. Dallaporta, 2000 .

Growth of silicon oxide on hydrogenated silicon during lithography with an atomic force microscope

D. Tonneau, H. Dallaporta, Vincent Bouchiat, 1998 .

Chemical-vapour-deposition growth and electrical characterization of intrinsic silicon nanowires

Thierry Baron, H. Jamgotchian, Bassem Salem, 2009 .