J. de Groot

Worst-case static noise margin criteria for logic circuits and their mathematical equivalence

J. Lohstroh, E. Seevinck, J. de Groot, 1983, IEEE Journal of Solid-State Circuits.

On the thermal stability margins of high-leakage current packaged devices

Chang-Chi Lee, J. de Groot, 2006, 2006 8th Electronics Packaging Technology Conference.