Rudolf T. Buhler

SOI Stacked Transistors Tolerance to Single-Event Effects

Renato C. Giacomini, Marcilei A. G. da Silveira, André L. Perin, 2019, IEEE Transactions on Device and Materials Reliability.

Experimental equipment design and setup for measuring electronic devices under magnetic fields

Renato C. Giacomini, Rudolf T. Buhler, Andre L. Perin, 2016, 2016 1st International Symposium on Instrumentation Systems, Circuits and Transducers (INSCIT).