V. V. Zverkov

Experimental methods for analyzing the reliability of the operating personnel and of tests of the control systems at nuclear power stations

B. I. Nigmatulin, V. V. Zverkov, 1998 .

Field ion microscopy of semiconductor compounds with imaging gas mixtures

V. V. Zverkov, E. I. Givargizov, A. N. Stepanova, 1988 .

Ion-beam etching as a technique for preparation of High-Tc superconductor microtips for field-ion microscopy

V. V. Zverkov, E. I. Givargizov, A. N. Stepanova, 1990 .