Stefaan Decoutere

1/f noise in deep submicron CMOS technology for RF and analogue applications

Cor Claeys, Eddy Simoen, Mercha Abdelkarim, 2004, SPIE International Symposium on Fluctuations and Noise.

Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors

Matteo Meneghini, Carlo De Santi, Enrico Zanoni, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Direct comparison of GaN-based e-mode architectures (recessed MISHEMT and p-GaN HEMTs) processed on 200mm GaN-on-Si with Au-free technology

Denis Marcon, Marleen Van Hove, Brice De Jaeger, 2015, Photonics West - Optoelectronic Materials and Devices.