David Sheridan

Test methods, test techniques and failure criteria for evaluation of ESD degradation of analog and radio frequency (RF) technology

Steven H. Voldman, Jay Rascoe, Brian Ronan, 2002, 2002 Electrical Overstress/Electrostatic Discharge Symposium.

Special Issue on Reliability

Elyse Rosenbaum, Gaudenzio Meneghesso, Ben Kaczer, 2019 .

Investigation of Gate Leakage Current Behavior for Commercial 1.2 kV 4H-SiC Power MOSFETs

Shengnan Zhu, Arash Salemi, Anant K. Agarwal, 2021, 2021 IEEE International Reliability Physics Symposium (IRPS).