T. Geinzer
发表
Y. Zhang,
J. C. H. Phang,
L. J. Balk,
2008,
Microelectron. Reliab..
Andreas Lindemann,
M. Thoben,
S. Cordes,
2016
.
R. Heiderhoff,
A. Pugatschow,
L.J. Balk,
2006,
2006 IEEE International Symposium on Power Semiconductor Devices and IC's.
J.C.H. Phang,
T. Geinzer,
L. Balk,
2008,
2008 IEEE International Reliability Physics Symposium.