Adam F. Hannon

Evaluating structure in thin block copolymer films with soft x-rays (Conference Presentation)

Hyo Seon Suh, R. Joseph Kline, Paul F. Nealey, 2017, Advanced Lithography.

Advancing x-ray scattering metrology using inverse genetic algorithms

Daniel F. Sunday, R. Joseph Kline, Adam F. Hannon, 2016, Journal of micro/nanolithography, MEMS, and MOEMS : JM3.

Inverting the design path for self-assembled block copolymers

Caroline A. Ross, Alfredo Alexander-Katz, Karim R. Gadelrab, 2017 .

Hierarchical Nanostructures by Sequential Self‐Assembly of Styrene‐Dimethylsiloxane Block Copolymers of Different Periods

Caroline A. Ross, Alfredo Alexander-Katz, K. W. Gotrik, 2011, Advanced materials.

Nanoscale spirals by directed self-assembly

Karl K. Berggren, Caroline A. Ross, Alfredo Alexander-Katz, 2017 .

Derivation of Multiple Covarying Material and Process Parameters Using Physics-Based Modeling of X-ray Data

Juan J. de Pablo, Venkatram Vishwanath, Nicola J. Ferrier, 2017 .