Philippe Perdu

发表

Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges

Philippe Perdu, Dean Lewis, V. Pouget, 2008 .

Frequency mapping in dynamic light emission with wavelet transform

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2013, Microelectron. Reliab..

Calculation of the optimal FIB milling and deposition operations for easier and faster circuit reconfiguration

Romain Desplats, Philippe Perdu, Timothee Dargnies, 2000 .

Dynamic Laser Stimulation Case Studies

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2005, Microelectron. Reliab..

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell

Philippe Perdu, Dean Lewis, Vincent Pouget, 2013, Microelectron. Reliab..

Silicon Thinning and Polishing on Packaged Devices

Romain Desplats, Philippe Perdu, Dean Lewis, 2001, Microelectron. Reliab..

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Femtosecond Laser Ablation for Backside Silicon Thinning

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2004, Microelectron. Reliab..

NIR laser stimulation for dynamic timing analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2005, Microelectron. Reliab..

Effect of physical defect on shmoos in CMOS DSM technologies

Philippe Perdu, Dean Lewis, Pascal Fouillat, 2008, Microelectron. Reliab..

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)

Philippe Perdu, Dean Lewis, David Trémouilles, 2003, Microelectron. Reliab..

Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning

Christian Boit, Philippe Perdu, Arkadiusz Glowacki, 2011, Microelectron. Reliab..

Pattern image enhancement by automatic focus correction

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2017, Microelectron. Reliab..

IR confocal laser microscopy for MEMS Technological Evaluation

Romain Desplats, Djemel Lellouchi, Philippe Perdu, 2002, Microelectron. Reliab..

Filtering and Emission Area Identification In the Time Resolved Imaging Data

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2012 .

Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2015, Microelectron. Reliab..

Microelectronics Reliability Volume 55, Issues 9–10

François Marc, Philippe Perdu, Nicolas Nolhier, 2015 .

IPFA 2011 ABSTRACT SUBMISSION

Philippe Perdu, Sanchez Kevin, 2011 .

Study of the ESD defects impact on ICs reliability

André Touboul, Philippe Perdu, Dean Lewis, 2004, Microelectron. Reliab..

Analysis of traps effect on AlGaN/GaN HEMT by luminescence techniques

Nathalie Labat, Nathalie Malbert, Benoit Lambert, 2008, Microelectron. Reliab..

Editorial, Microelectronics Reliability, Volume 55, Issues 9–10, August–September 2015

François Marc, Philippe Perdu, Nicolas Nolhier, 2015 .

Understanding the effects of NIR laser stimulation on NMOS transistor

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2004, Microelectron. Reliab..

Side-Channel Improvment by Laser Stimulation

Lionel Torres, Bruno Rouzeyre, Philippe Perdu, 2010 .

A New Versatile Testing Interface for Failure Analysis in Integrated Circuits

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2001, Microelectron. Reliab..

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Optimum Si thickness for backside detection of photon emission using Si-CCD

Christian Boit, Philippe Perdu, Arkadiusz Glowacki, 2012, Microelectron. Reliab..

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation

Philippe Perdu, Dean Lewis, Pascal Fouillat, 2006, Microelectron. Reliab..

Oxide charge measurements in EEPROM devices

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2005, Microelectron. Reliab..

Dynamic study of the thermal laser stimulation response on advanced technology structures

Philippe Perdu, M. de la Bardonnie, Patrick Poirier, 2008, Microelectron. Reliab..

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

VLSI functional analysis by dynamic emission microscopy

Philippe Perdu, Tomonori Nakamura, Sylvain Dudit, 2010, Microelectron. Reliab..

Magnetic emission mapping for passive integrated components characterisation

Romain Desplats, Philippe Descamps, Philippe Perdu, 2003, Microelectron. Reliab..

Backside spectroscopic photon emission microscopy using intensified silicon CCD

Christian Boit, Philippe Perdu, Arkadiusz Glowacki, 2014, Microelectron. Reliab..

A way to implement the electro-optical technique to inertial MEMS

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2015, Microelectron. Reliab..

Backside Hot Spot Detection Using Liquid Crystal Microscopy

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Application of various optical techniques for ESD defect localization

André Touboul, Philippe Perdu, Dean Lewis, 2006, Microelectron. Reliab..

Methodology to support laser-localized soft defects on analog and mixed-mode advanced ICs

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2009, 2009 IEEE International Reliability Physics Symposium.

When Failure Analysis Meets Side-Channel Attacks

Bruno Rouzeyre, Lionel Torres, Philippe Perdu, 2010, CHES.

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?

Romain Desplats, Philippe Perdu, J. P. Roux, 2004, Microelectron. Reliab..

Automatic process for time-frequency scan of VLSI

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2016, Microelectron. Reliab..

Identification of Process/Design Issues during 0.18μm Technology Qualification for Space Application

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2007, 2007 Design, Automation & Test in Europe Conference & Exhibition.

Fault localization using time resolved photon emission and stil waveforms

Romain Desplats, Ketan Shah, Philippe Perdu, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

High performance thermography with InGaAs photon counting camera

Maryse Béguin, Philippe Perdu, Dean Lewis, 2012, Microelectron. Reliab..

Radon-Transform-Based Image Enhancement for Microelectronic Chip Inspection

Zeev Zalevsky, Eran Gur, Philippe Perdu, 2010, IEEE Transactions on Device and Materials Reliability.

Long-term reliability of silicon bipolar transistors subjected to low constraints

Philippe Perdu, Laurent Escotte, Marise Bafleur, 2007, Microelectron. Reliab..

Electrical modeling for laser testing with different pulse durations

Philippe Perdu, Dean Lewis, Pascal Fouillat, 2005, 11th IEEE International On-Line Testing Symposium.

A method of comparison of stored of pixels existing images that represent at least one integrated circuit äquipotentielen

Romain Desplats, Philippe Perdu, 1999 .

Solar Cell Analysis with Light Emission and OBIC Techniques

Romain Desplats, Philippe Perdu, Kevin Sanchez, 2003, Microelectron. Reliab..

Time Resolved Photon Emission Processing Flow for IC Analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2004, Microelectron. Reliab..

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling

Franco Stellari, Alan J. Weger, Peilin Song, 2003, Microelectron. Reliab..

Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards

Romain Desplats, Philippe Perdu, C. Guérin, 2006, Microelectron. Reliab..

A physical approach on SCOBIC investigation in VLSI

Philippe Perdu, Dean Lewis, Yves Danto, 2003, Microelectron. Reliab..

Life issues, robustness consequences and reliability challenges for Very Deep Sub Micron technologies

Philippe Perdu, 2010, 2010 Asia-Pacific International Symposium on Electromagnetic Compatibility.

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation

Romain Desplats, Philippe Perdu, Dean Lewis, 2001, Microelectron. Reliab..

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing

Hervé Lapuyade, André Touboul, Philippe Perdu, 2001, Microelectron. Reliab..

Shorter failure analysis using a new application of IDDQ for defect localization in ICs

Romain Desplats, J. Benbrik, François Marc, 1998, Advanced Lithography.

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2008, Microelectron. Reliab..

A comprehensive study of the application of the EOP techniques on bipolar devices

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2014, Microelectron. Reliab..

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization

Chee Lip Gan, Philippe Perdu, Dean Lewis, 2011, Microelectron. Reliab..

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations

Philippe Perdu, Dean Lewis, Fulvio Infante, 2010, Microelectron. Reliab..

Short defect characterization based on TCR parameter extraction

Philippe Perdu, Gérald Haller, Vincent Goubier, 2003, Microelectron. Reliab..

Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics

Philippe Perdu, Alain Bravaix, B. Foucher, 2009, Microelectron. Reliab..

Faster fault isolation using a dichotomy reduction of node candidates

Romain Desplats, Philippe Perdu, Guy Rolland, 2000 .

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications

Philippe Perdu, David Trémouilles, Nicolas Guitard, 2004, Microelectron. Reliab..

Study of passivation defects by electroluminescence in AlGaN/GaN HEMTS on SiC

G. Pataut, Nathalie Labat, Nathalie Malbert, 2007, Microelectron. Reliab..

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2005, Microelectron. Reliab..

Defect localization using voltage contrast IDDQ testing

Romain Desplats, Philippe Perdu, 1999 .

Impact of semiconductors material on IR Laser Stimulation signal

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2005, Microelectron. Reliab..

Failure Localization and design debug on mixed-mode ICs by using the dynamic laser stimulation techniques

Philippe Perdu, Kevin Sanchez, Olivier Crepel, 2007 .

Implementation of TRE systems into Emission Microscopes

Romain Desplats, Alberto Tosi, Franco Zappa, 2004, Microelectron. Reliab..

CADless laser assisted methodologies for failure analysis and device reliability

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2010, Microelectron. Reliab..

Magnetic imaging for resistive, capacitive and inductive devices; from theory to piezo actuator failure localization

Vincent Bley, Thierry Lebey, Philippe Perdu, 2015, Microelectron. Reliab..

New methodology for localizing faults in programmable and commercial circuits

Romain Desplats, François Marc, Philippe Perdu, 1997 .

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below)

Philippe Perdu, Dean Lewis, Guillaume Celi, 2010, Microelectron. Reliab..

François Marc, Hélène Frémont, Philippe Perdu, 2015, Microelectron. Reliab..

Validation of differential light emission analysis on FPGA

Bruno Rouzeyre, Lionel Torres, Philippe Perdu, 2009, 2009 3rd International Conference on Signals, Circuits and Systems (SCS).

Unsupervised learning for signal mapping in dynamic photon emission

Chee Lip Gan, Stéphane Binczak, Philippe Perdu, 2015, Microelectron. Reliab..

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis

A. Benigni, Philippe Perdu, Dean Lewis, 2011, Microelectron. Reliab..

Modeling Thermal Laser Stimulation

Romain Desplats, Philippe Perdu, X. Chauffleur, 2001, Microelectron. Reliab..

Magnetic field measurements for Non Destructive Failure Analysis

Philippe Descamps, Philippe Perdu, Bernadette Domengès, 2002, Microelectron. Reliab..

Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2015, J. Electronic Imaging.

VLSIの時間‐周波数スキャンのための自動プロセス【Powered by NICT】

Stéphane Binczak, Philippe Perdu, Anthony Boscaro, 2016 .

Effects of voltage stress on the single event upset (SEU) response of 65 nm flip flop

Chee Lip Gan, Philippe Perdu, Kevin Sanchez, 2016, Microelectron. Reliab..

Generic simulator for faulty IC

Philippe Perdu, Dean Lewis, Julie Ferrigno, 2008, Microelectron. Reliab..

Failure analysis by dynamic voltage contrast development of a semi-automatic system

Philippe Perdu, Guy Perez, Nadine Geraud-Liria, 1987 .

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis

Philippe Perdu, Dean Lewis, Guillaume Celi, 2011, Microelectron. Reliab..

Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology

Philippe Perdu, M. de la Bardonnie, Patrick Poirier, 2008, Microelectron. Reliab..

Magnetic microscopy for ICs failure analysis : comparative case studies using SQUID, GMR and MTJ systems

Romain Desplats, Philippe Perdu, Gérald Haller, 2004, Microelectron. Reliab..

Method and installation for rapidly locating a fault in an integrated circuit

Romain Desplats, Philippe Perdu, 1998 .

Failure analysis of micro-heating elements suspended on thin membranes

Jérôme Courbat, Nico F. de Rooij, Romain Desplats, 2005, Microelectron. Reliab..

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications

Philippe Perdu, Kevin Sanchez, Felix Beaudoin, 2007, Microelectron. Reliab..

Automatic emission spots identification in static and dynamic imaging by research of local maxima.

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2014 .

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

Automatic defect localization in VLSI circuits: A fusion approach based on the Dempster-Shafer theory

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2017, 2017 20th International Conference on Information Fusion (Fusion).

Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package

Philippe Perdu, Dean Lewis, Fulvio Infante, 2009, Microelectron. Reliab..

Automatic localization of signal sources in photon emission images for integrated circuit analysis

Stéphane Binczak, Philippe Perdu, Sabir Jacquir, 2018, Signal Image Video Process..

Multi variation mapping for Dynamic Laser Stimulation analysis

Philippe Perdu, Sanchez Kevin, 2011, 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology

Philippe Perdu, Dean Lewis, Vincent Pouget, 2013, IEEE Transactions on Nuclear Science.

Dynamic Laser Stimulation Technique for device qualification process

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2008 .

Implementing laser-based failure analysis methodologies using test vehicles

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2005 .

Optimizing Pulsed OBIC Technique for ESD Defect Localization

Philippe Perdu, Dean Lewis, Nicolas Guitard, 2007 .

A new approach for faster IC analysis with PICA: STPC-3D

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.

Backside laser testing of ICs for SET sensitivity evaluation

Hervé Lapuyade, D. Lewis, Philippe Perdu, 2001 .

Thermal Frequency Imaging : A new application of Laser Voltage Imaging applied on 40 nm technology

Philippe Perdu, Dean Lewis, Guillaume Celi, 2011 .

Induced damages on CMOS and bipolar integrated structures under focused ion beam irradiation

Romain Desplats, J. Benbrik, Bruno Benteo, 1998 .

A review of sample backside preparation techniques for VLSI

Romain Desplats, Philippe Perdu, Felix Beaudoin, 2000 .

Analysis and compact modeling of a vertical grounded-base NPN bipolar transistor used as an ESD protection in a smart power technology

Philippe Perdu, Nicolas Mauran, Nicolas Nolhier, 2000, Proceedings of the 2000 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.00CH37124).

New non-destructive laser ablation based backside sample preparation method

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2000 .

Implementing Thermal Laser and Photoelectric Laser Stimulation in a failure analysis laboratory

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.