Dean Lewis

发表

Failure analysis of advanced CMOS technology: some trends, state of the art and future challenges

Philippe Perdu, Dean Lewis, V. Pouget, 2008 .

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell

Philippe Perdu, Dean Lewis, Vincent Pouget, 2013, Microelectron. Reliab..

Silicon Thinning and Polishing on Packaged Devices

Romain Desplats, Philippe Perdu, Dean Lewis, 2001, Microelectron. Reliab..

Using the SEEM software for SET testing and analysis

Dean Lewis, Vincent Pouget, Pascal Fouillat, 2007 .

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Theoretical Investigation of an Equivalent Laser LET

Hervé Lapuyade, Dean Lewis, Pascal Fouillat, 2001, Microelectron. Reliab..

NIR laser stimulation for dynamic timing analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2005, Microelectron. Reliab..

Effect of physical defect on shmoos in CMOS DSM technologies

Philippe Perdu, Dean Lewis, Pascal Fouillat, 2008, Microelectron. Reliab..

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)

Philippe Perdu, Dean Lewis, David Trémouilles, 2003, Microelectron. Reliab..

Study of the ESD defects impact on ICs reliability

André Touboul, Philippe Perdu, Dean Lewis, 2004, Microelectron. Reliab..

Understanding the effects of NIR laser stimulation on NMOS transistor

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2004, Microelectron. Reliab..

Using the SEEM Software for Laser SET Testing and Analysis

Dean Lewis, Vincent Pouget, Pascal Fouillat, 2007 .

Recent developments for SEE testing at the ATLAS laser facility

Dean Lewis, Vincent Pouget, Pascal Fouillat, 2006 .

Effects of 1064 nm laser on MOS capacitor

Dean Lewis, Pascal Masson, Vincent Pouget, 2012, Microelectron. Reliab..

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation

Philippe Perdu, Dean Lewis, Pascal Fouillat, 2006, Microelectron. Reliab..

A Review and some Future Prospects on Laser-Based Techniques for Single-Event Effects Testing and Analysis

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2005 .

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

A new laser system for X-rays flashes sensitivity evaluation

Hervé Lapuyade, Yann Deval, Dean Lewis, 2001, Proceedings Seventh International On-Line Testing Workshop.

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits

Dean Lewis, Yves Danto, Vincent Pouget, 2003, Microelectron. Reliab..

A way to implement the electro-optical technique to inertial MEMS

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2015, Microelectron. Reliab..

Backside Hot Spot Detection Using Liquid Crystal Microscopy

Romain Desplats, Philippe Perdu, Dean Lewis, 2002, Microelectron. Reliab..

Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology

Jean-Max Dutertre, Assia Tria, Mathieu Lisart, 2012, Microelectron. Reliab..

Application of various optical techniques for ESD defect localization

André Touboul, Philippe Perdu, Dean Lewis, 2006, Microelectron. Reliab..

Methodology to support laser-localized soft defects on analog and mixed-mode advanced ICs

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2009, 2009 IEEE International Reliability Physics Symposium.

Identification of Process/Design Issues during 0.18μm Technology Qualification for Space Application

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2007, 2007 Design, Automation & Test in Europe Conference & Exhibition.

High performance thermography with InGaAs photon counting camera

Maryse Béguin, Philippe Perdu, Dean Lewis, 2012, Microelectron. Reliab..

Electrical modeling for laser testing with different pulse durations

Philippe Perdu, Dean Lewis, Pascal Fouillat, 2005, 11th IEEE International On-Line Testing Symposium.

Time Resolved Photon Emission Processing Flow for IC Analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2004, Microelectron. Reliab..

Validation of radiation hardened designs by pulsed laser testing and SPICE analysis

Hervé Lapuyade, Dean Lewis, Pascal Fouillat, 1999 .

A physical approach on SCOBIC investigation in VLSI

Philippe Perdu, Dean Lewis, Yves Danto, 2003, Microelectron. Reliab..

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation

Romain Desplats, Philippe Perdu, Dean Lewis, 2001, Microelectron. Reliab..

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing

Hervé Lapuyade, André Touboul, Philippe Perdu, 2001, Microelectron. Reliab..

Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2008, Microelectron. Reliab..

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2004, IEEE Transactions on Instrumentation and Measurement.

Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections

Romain Desplats, Dean Lewis, Pascal Fouillat, 2004, Microelectron. Reliab..

A comprehensive study of the application of the EOP techniques on bipolar devices

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2014, Microelectron. Reliab..

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

Electrical modeling of the effect of beam profile for pulsed laser fault injection

Mathieu Lisart, Dean Lewis, Vincent Pouget, 2009, Microelectron. Reliab..

Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization

Chee Lip Gan, Philippe Perdu, Dean Lewis, 2011, Microelectron. Reliab..

Magnetic microscopy for ground plane current detection: a fast and reliable technique for current leakage localization by means of magnetic simulations

Philippe Perdu, Dean Lewis, Fulvio Infante, 2010, Microelectron. Reliab..

Laser cross section measurement for the evaluation of single-event effects in integrated circuits

Hervé Lapuyade, Dean Lewis, Pascal Fouillat, 2000 .

An overview of the applications of a pulsed laser system for SEU testing

Hervé Lapuyade, Dean Lewis, S. Duzellier, 2000, Proceedings 6th IEEE International On-Line Testing Workshop (Cat. No.PR00646).

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis

Romain Desplats, Philippe Perdu, Dean Lewis, 2005, Microelectron. Reliab..

Impact of semiconductors material on IR Laser Stimulation signal

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2005, Microelectron. Reliab..

Photoelectric Laser Stimulation applied to Latch-Up phenomenon and localization of parasitic transistors in an industrial failure analysis laboratory

Dean Lewis, Vincent Pouget, Gérald Haller, 2011, Microelectron. Reliab..

CADless laser assisted methodologies for failure analysis and device reliability

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2010, Microelectron. Reliab..

Net integrity checking by optical localization techniques

Dean Lewis, Vincent Pouget, Aziz Machouat, 2009, Microelectron. Reliab..

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below)

Philippe Perdu, Dean Lewis, Guillaume Celi, 2010, Microelectron. Reliab..

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis

A. Benigni, Philippe Perdu, Dean Lewis, 2011, Microelectron. Reliab..

Generic simulator for faulty IC

Philippe Perdu, Dean Lewis, Julie Ferrigno, 2008, Microelectron. Reliab..

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis

Philippe Perdu, Dean Lewis, Guillaume Celi, 2011, Microelectron. Reliab..

Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection

Raoul Velazco, Dean Lewis, Pascal Fouillat, 2008, 2008 14th IEEE International On-Line Testing Symposium.

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

Student Understanding Of Normal And Shear Stress And Deformations In Axially Loaded Members

Shane Brown, Dean Lewis, 2010 .

Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package

Philippe Perdu, Dean Lewis, Fulvio Infante, 2009, Microelectron. Reliab..

Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2007 .

Negative Bias Temperature Instability Effect on the Single Event Transient Sensitivity of a 65 nm CMOS Technology

Philippe Perdu, Dean Lewis, Vincent Pouget, 2013, IEEE Transactions on Nuclear Science.

Testing of the quality of solder joints through the analysis of their thermal behaviour with an interferometric laser probe

Dean Lewis, Yves Danto, Stefan Dilhaire, 1994 .

Dynamic Laser Stimulation Technique for device qualification process

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2008 .

Implementing laser-based failure analysis methodologies using test vehicles

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2005 .

Optimizing Pulsed OBIC Technique for ESD Defect Localization

Philippe Perdu, Dean Lewis, Nicolas Guitard, 2007 .

INVESTIGATION OF SINGLE-EVENT TRANSIENTS IN FAST INTEGRATED CIRCUITS WITH A PULSED LASER

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2004 .

The method of dynamic separation and its application to quantitative thermal analysis of microelectronic devices by laser interferometry and reflectometry

Dean Lewis, Stefan Dilhaire, Wilfrid Claeys, 1997 .

Elaboration of a New Pulsed Laser System for SEE Testing

Hervé Lapuyade, Raoul Velazco, Dean Lewis, 1998 .

Study of the interaction between heavy ions and integrated circuits using a pulsed laser beam

Hervé Lapuyade, Dean Lewis, Pascal Fouillat, 2002 .

SET sensitive volume imaging and measurement with two-photon absorption laser testing

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2008 .

Thermal Frequency Imaging : A new application of Laser Voltage Imaging applied on 40 nm technology

Philippe Perdu, Dean Lewis, Guillaume Celi, 2011 .

New non-destructive laser ablation based backside sample preparation method

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2000 .

Thermomechanical study of AlCu based interconnect under pulsed thermoelectric excitation

Dean Lewis, Stefan Dilhaire, Wilfrid Claeys, 1997 .

Laser beam thermography of circuits in the particular case of passivated semiconductors

G. Deboy, Dean Lewis, Stefan Dilhaire, 1996 .

Implementing Thermal Laser and Photoelectric Laser Stimulation in a failure analysis laboratory

Philippe Perdu, Dean Lewis, Felix Beaudoin, 2003, Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003.