Seung Jin Yeom

Dependence of Switching Characteristics on Fabrication Process and Capacitor Size for Pt/SBT/Pt Ferroelectric Capacitor

Woo Seok Yang, Chung Tae Kim, Seung Jin Yeom, 1999 .

Ferroelectric Performance of Fully Integrated(Bi, La)_4Ti_3O_ Capacitor for Ferroelectric Memory

Seok Won Lee, Suk-Kyoung Hong, Chang Goo Lee, 2001 .

Intrinsic stress dependence of Pt hillock formation and its related electrical properties of SBT capacitor

Seung Jin Yeom, Nam Kyeong Kim, S. Yeom, 1999 .

Platinum(100) hillock growth in a Pt/Ti electrode stack for ferroelectric random access memory

Seung Jin Yeom, S. Yeom, Soon Yong Kweon, 2003 .

Grain size monitoring of 3D flash memory channel poly-Si using multiwavelength Raman spectroscopy

Woo Sik Yoo, Takeshi Ueda, Kitaek Kang, 2014, 2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS).

Effect of nitrogen incorporation on improvement of leakage properties in high-k HfO2 capacitors treated by N2-plasma

Soon-Gil Yoon, Jae Sung Roh, Seung Jin Yeom, 2005 .

The characteristics of Cu-drift induced dielectric breakdown under alternating polarity bias temperature stress

Byoung-Joon Kim, Young-Chang Joo, Seung Jin Yeom, 2009, 2009 IEEE International Reliability Physics Symposium.

Platinum Hillocks in Pt/Ti Film Stacks Deposited on Thermally Oxidized Si Substrate

Jae Sung Roh, Seung Jin Yeom, J. Roh, 2001 .