Geert Seuren
发表
Lei Ma,
Robert Van Rijsinge,
Corné Bastiaansen,
2007,
J. Electron. Test..
Tom Waayers,
Geert Seuren,
2004,
2004 International Conferce on Test.
Taco Zwemstra,
Richard Morren,
Bert Atzema,
1993,
Proceedings of IEEE International Test Conference - (ITC).
Jan Schat,
Frank van der Heyden,
Vladimir A. Zivkovic,
2009,
IEEE Design & Test of Computers.