N. Garbar

Drain currents and their excess noise in triple gate bulk p-channel FinFETs of different geometry

Cor Claeys, Eddy Simoen, N. Lukyanchikova, 2013, Microelectron. Reliab..

Analytical Model for the Impact of the Twin Gate on the Floating-Body-Related Low-Frequency Noise Overshoot in Silicon-on-Insulator MOSFETs

E. Simoen, C. Claeys, N. Lukyanchikova, 2006, IEEE Transactions on Electron Devices.

Linear-kink-noise suppression in partially depleted SOI using the twin-gate MOSFET configuration

E. Simoen, C. Claeys, N. Lukyanchikova, 2005, IEEE Electron Device Letters.

1/f noise and generation/recombination noise in SiGe HBTs on SOI

P. Ashburn, O. Buiu, N. Lukyanchikova, 2005, IEEE Transactions on Electron Devices.

Excess Lorentzian noise in partially depleted SOI nMOSFETs induced by an accumulation back-gate bias

E. Simoen, C. Claeys, N. Lukyanchikova, 2004, IEEE Electron Device Letters.

Back-Gate Induced Noise Overshoot in Partially-Depleted SOI MOSFETs

Cor Claeys, Eddy Simoen, N. Lukyanchikova, 2005 .