Ramses van der Toorn

Analysis of the local extraction method of base and thermal resistance of bipolar transistors

Robert Setekera, Luuk Tiemeijer, Willy Kloosterman, 2014, 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).

RF-Noise Modeling in Advanced CMOS Technologies

Ramses van der Toorn, Andries J. Scholten, Geert D. J. Smit, 2014, IEEE Transactions on Electron Devices.

RF small signal avalanche characterization and repercussions on bipolar transistor circuit design

Ramses van der Toorn, Vladimir Milovanovic, 2009, IEEE EUROCON 2009.

Comparative analysis of compact noise model formulations for SiGe-HBTs

Ramses van der Toorn, Francesco Vitale, 2013, 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).

Local extraction of base and thermal resistance of bipolar transistors

Robert Setekera, Ramses van der Toorn, W. Kloosterman, 2013, 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).