David Trémouilles

发表

Technology-aware ESD-reliable RF CMOS circuit design

Natarajan Mahadeva Iyer, Mirko Scholz, Dimitri Linten, 2006 .

RF ESD protection strategies - the design and performance trade-off challenges

Dimitri Linten, Steven Thijs, Guido Groeseneken, 2005, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005..

An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices

Robert Plana, Fabio Coccetti, David Trémouilles, 2012, IEEE Transactions on Instrumentation and Measurement.

Optimization of a MOS-IGBT-SCR ESD protection component in smart power SOI technology

David Trémouilles, Marise Bafleur, Houssam Arbess, 2015, Microelectron. Reliab..

Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)

Philippe Perdu, Dean Lewis, David Trémouilles, 2003, Microelectron. Reliab..

Transient voltage overshoot in TLP testing — Real or artifact?

Philippe Roussel, Steven Thijs, Guido Groeseneken, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

Next generation FinFET devices in bulk silicon technology and their benefits for ESD robustness

Mirko Scholz, Dimitri Linten, Liesbeth Witters, 2009 .

Analysis of an ESD failure mechanism on a SiC MESFET

Philippe Godignon, Dominique Tournier, Karine Isoird, 2014, Microelectron. Reliab..

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization

Romain Desplats, Philippe Perdu, Dean Lewis, 2003, Microelectron. Reliab..

Impact of new technology options on the ESD robustness of sub-45 nm FinFET technology

Natarajan Mahadeva Iyer, Mirko Scholz, Dimitri Linten, 2006 .

New triggering-speed-characterization method for diode-triggered SCR using TLP

David Trémouilles, Marise Bafleur, Mouna Mahane, 2017, Microelectron. Reliab..

Impact of CMOS Scaling and Technology Options on ESD Reliability

Natarajan Mahadeva Iyer, Dimitri Linten, Steven Thijs, 2005 .

Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD)

David Trémouilles, Marise Bafleur, E. Bouyssou, 2009, Microelectron. Reliab..

Design methodology for FinFET GG-NMOS ESD protecction devices

Charvaka Duvvury, Mirko Scholz, Dimitri Linten, 2008 .

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation

Romain Desplats, Philippe Perdu, Dean Lewis, 2001, Microelectron. Reliab..

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications

Philippe Perdu, David Trémouilles, Nicolas Guitard, 2004, Microelectron. Reliab..

Tackling the challenges of System level ESD: from efficient ICs ESD protection to system level predictive modeling

David Trémouilles, Nicolas Nolhier, Marise Bafleur, 2013 .

A new electro-optical transmission-line measurement-method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance

G. Toulon, David Trémouilles, Frederic Morancho, 2018, Microelectron. Reliab..

Failure analysis of ESD-stressed SiC MESFET

Philippe Godignon, Dominique Tournier, Karine Isoird, 2015, Microelectron. Reliab..

Investigation on Statistical Tools to Analyze Repetitive-Electrostatic-Discharge Endurance of System-Level Protections

David Trémouilles, Marise Bafleur, Marianne Diatta, 2012 .

Investigation on damaged planar-oxide of 1200 V SiC power MOSFETs in non-destructive short-circuit operation

Stéphane Lefebvre, Frédéric Richardeau, F. Boige, 2017, Microelectron. Reliab..

Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology

Philippe Perdu, David Trémouilles, Nicolas Mauran, 2001 .

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation

David Trémouilles, Nicolas Monnereau, Nicolas Nolhier, 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010.

A plug-and-play wideband RF circuit ESD protection methodology: T-diodes

Mirko Scholz, Dimitri Linten, Jonathan Borremans, 2009, Microelectron. Reliab..

Accelerated lifetime test of RF-MEMS switches under ESD stress

Robert Plana, Vincent Puyal, Fabio Coccetti, 2009, Microelectron. Reliab..

Size Effect on Properties of Varistors Made From Zinc Oxide Nanoparticles Through Low Temperature Spark Plasma Sintering

Myrtil L. Kahn, David Trémouilles, Marise Bafleur, 2009 .

Reliability assessment of electrostatically driven MEMS devices: based on a pulse-induced charging technique

Robert Plana, Fabio Coccetti, David Trémouilles, 2012 .