A. Makosiej

Back-bias impact on variability and BTI for 3D-monolithic 14nm FDSOI SRAMs applications

X. Garros, D. Bosch, G. Cibrario, 2019, 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS).

TFET/CMOS hybrid pseudo dual-port SRAM for scratchpad applications

A. Makosiej, A. Vladimirescu, A. Amara, 2015, EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon.

Direct measurement of the dynamic variability of 0.120µm2 SRAM cells in 28nm FD-SOI technology

A. Subirats, X. Garros, J. El Husseini, 2014, 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers.

Novel Fine-Grain Back-Bias Assist Techniques for 14nm FDSOI Top-Tier SRAMs integrated in 3D-Monolithic

X. Garros, D. Bosch, G. Cibrario, 2019, 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA).