E. De Backer

Integrated submicron switching transistor breaking the Si limit at 100 V

Filip Bauwens, Peter Moens, M. Tack, 2008 .

MIMC Reliability and Electrical Behavior Defined by a Physical Layer Property of the Dielectric

Jean-Pierre Raskin, Rémy Charavel, Alexandru Vlad, 2008 .

MIMC reliability and electrical behavior defined by a physical layer property of the dielectric

L. De Schepper, B. Vlachakis, E. De Backer, 2008, Microelectron. Reliab..