Maurizio Dapor

发表

A novel Monte Carlo simulation code for linewidth measurement in critical dimension scanning electron microscopy

Wolfgang Fichtner, Stephan Holzer, Mauro Ciappa, 2010, Scanning Microscopies.

Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy

Wolfgang Fichtner, Mauro Ciappa, Alexander Koschik, 2010, Microelectron. Reliab..

Computer simulation of electron transport in solids with applications to materials analysis and characterization

Maurizio Dapor, M. Dapor, 2013 .

New Frontiers in Multiscale Modelling of Advanced Materials

Nicola Pugno, Simone Taioli, Maurizio Dapor, 2016 .

Slow electrons impinging on dielectric solids. II. Implantation profiles, electron mobility, and recombination processes

Antonio Miotello, Maurizio Dapor, M. Dapor, 1997 .

Monte Carlo modeling in the low-energy domain of the secondary electron emission of polymethylmethacrylate for critical-dimension scanning electron microscopy

Wolfgang Fichtner, Mauro Ciappa, Maurizio Dapor, 2010 .

Monte Carlo Simulation of Secondary Electron Emission from Dielectric Targets

Maurizio Dapor, M. Dapor, 2012 .

Secondary electron emission yield calculation performed using two different Monte Carlo strategies

Maurizio Dapor, M. Dapor, 2011 .

Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films

Maurizio Dapor, 2008 .

Laser-driven acceleration of protons from hydrogenated annealed silicon targets

Josef Krasa, Bedrich Rus, Pierluigi Bellutti, 2010 .

Backscattering of low energy electrons from carbon films deposited on aluminum: A Monte Carlo simulation

Maurizio Dapor, M. Dapor, 2004 .

A Quantum Chemical Interpretation of Two-Dimensional Electronic Spectroscopy of Light-Harvesting Complexes.

Benedetta Mennucci, Sandro Jurinovich, Lorenzo Cupellini, 2017, Journal of the American Chemical Society.