Adalberto Nobiato Crespo

Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504

Mario Jino, Clenio F. Salviano, Paulo Marcos Siqueira Bueno, 2008, JIISIC.

Aplicação de um Checklist de Pré-Teste

Mario Jino, Adalberto Nobiato Crespo, Odair Jacinto da Silva, 2008, JIISIC.

PROMETEU - a tool to support documents generation and traceability in the test process

Mario Jino, Adalberto Nobiato Crespo, Jorge Luiz da Cruz, 2008, JIISIC.

Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of CMMI

Mario Jino, Paulo Marcos Siqueira Bueno, Adalberto Nobiato Crespo, 2006, PROFES.

Sensitivity of reliability-growth models to operational profile errors vs. testing accuracy [software testing]

Alberto Pasquini, Adalberto Nobiato Crespo, Paolo Matrella, 1996, IEEE Trans. Reliab..

Relationships between code coverage of the potential-uses criteria and software reliability

Mario Jino, Alberto Pasquini, Adalberto Nobiato Crespo, 2000 .

A binomial software reliability model based on coverage of structural testing criteria

Mario Jino, Alberto Pasquini, Adalberto Nobiato Crespo, 2000, Empirical Software Engineering.

Applying Code Coverage Approach to an Infinite Failure Software Reliability Model

Mario Jino, Alberto Pasquini, Adalberto Nobiato Crespo, 2009, 2009 XXIII Brazilian Symposium on Software Engineering.

Uma Estratégia para Melhoria de Processo de Software nas Empresas Brasileiras

Ana Regina Cavalcanti da Rocha, Márcio Pecegueiro do Amaral, Káthia Marçal de Oliveira, 2004, QUATIC.

Sensitivity of Two Coverage-Based Software Reliability Models to Variations in the Operational Profile

Mario Jino, Adalberto Nobiato Crespo, Odair Jacinto da Silva, 2010, 2010 Fourth International Conference on Secure Software Integration and Reliability Improvement.

Experimental Comparison of Software Reliability Models Based on Code Coverage and on Time Domain

Mario Jino, Adalberto Nobiato Crespo, Odair Jacinto da Silva, 2016, 2016 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C).

Application of the IEEE 829 Standard as a Basis for Structuring the Testing Process

Mario Jino, Adalberto Nobiato Crespo, Marcia Regina, 2002 .

Sensitivity of reliability growth models to operational profile errors

Alberto Pasquini, Adalberto Nobiato Crespo, Paolo Matrella, 1996, Proceedings of ISSRE '96: 7th International Symposium on Software Reliability Engineering.