D. Vigar

Hot carrier aging and its variation under use-bias: Kinetics, prediction, impact on Vdd and SRAM

A. Asenov, G. Groeseneken, B. Kaczer, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

A study of the linearity between Ion and log Ioff of modern MOS transistors and its application to stress engineering

W. S. Lau, D. Vigar, Peizhen Yang, 2008, Microelectron. Reliab..

Interaction between hot carrier aging and PBTI degradation in nMOSFETs: Characterization, modelling and lifetime prediction

G. Groeseneken, B. Kaczer, A. Asenov, 2017, 2017 IEEE International Reliability Physics Symposium (IRPS).

Addressable test structures for MOSFET variability analysis

M. Redford, D. Vigar, R. Herberholz, 2012, 2012 IEEE International Conference on Microelectronic Test Structures.

Stress migration reliability of wide Cu interconnects with gouging vias

D. Vigar, C.M. Tan, K. Pey, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..

Yield & Reliability challenges of BEOL Interconnects

D. Vigar, J.B. Tan, W. Lu, 2006, 2006 International Interconnect Technology Conference.