A.K. Henning

发表

Thermionic emission probability for semiconductor-insulator interfaces

J.D. Plummer, A.K. Henning, 1987, IEEE Transactions on Electron Devices.

Substrate current at cryogenic temperatures: Measurements and a two-dimensional model for CMOS technology

J.D. Plummer, A.K. Henning, N.N. Chan, 1987, IEEE Transactions on Electron Devices.