K. Tateiwa
发表
Y. Kato,
H. Masuda,
M. Fujimoto,
1999,
1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).
T. Ohzone,
S. Odanaka,
K. Tateiwa,
1987,
1987 International Electron Devices Meeting.