Seungjin Choo

Charge-collection modeling for SER simulation in FinFETs

Jongwook Jeon, Keun-Ho Lee, Udit Monga, 2016, 2016 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).

Experimental study on BTI variation impacts in SRAM based on high-k/metal gate FinFET: From transistor level Vth mismatch, cell level SNM to product level Vmin

Hyunjin Kim, Seungjin Choo, Soonyoung Lee, 2015, 2015 IEEE International Electron Devices Meeting (IEDM).

Hot carrier reliability characterization in consideration of self-heating in FinFET technology

Seungjin Choo, Sangwoo Pae, Minjung Jin, 2016, 2016 IEEE International Reliability Physics Symposium (IRPS).