Shuying Qi

Analog Circuit Testing Using Built-In Direct-Digital Synthesis

Dayu Yang, Charles E. Stroud, F. F. Dai, 2004 .

Automatic linearity (IP3) test with built-in pattern generator and analyzer

Foster F. Dai, Dayu Yang, Charles E. Stroud, 2004, 2004 International Conferce on Test.

Automatic linearity (IP3) test with built-in pattern generator and analyzer

Charles E. Stroud, Fa Foster Dai, D. Yang, 2004 .