F. Essely

发表

Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure

N. Nolhier, P. Perdu, V. Pouget, 2005, Microelectron. Reliab..

Optimizing Pulsed OBIC Technique for ESD Defect Localization

Philippe Perdu, Dean Lewis, Nicolas Guitard, 2007 .

Investigation of Single-Event Transients in Linear Voltage Regulators

V. Pouget, J.S. Laird, F. Irom, 2008, IEEE Transactions on Nuclear Science.