A. Oelsner

Actinic EUVL mask blank defect inspection by EUV photoelectron microscopy

Gerd Schoenhense, Ulrich Heinzmann, Ulf Kleineberg, 2006, SPIE Advanced Lithography.

Time-of-flight-photoelectron emission microscopy on plasmonic structures using attosecond extreme ultraviolet pulses

Mark I. Stockman, S. H. Chew, Alexander Guggenmos, 2012 .

Time- and energy resolved photoemission electron microscopy-imaging of photoelectron time-of-flight analysis by means of pulsed excitations

Martin Aeschlimann, Daniela Bayer, Martin Rohmer, 2010 .

Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter

Oliver G. Schmidt, M. Escher, M. Merkel, 2001 .

Microspectroscopy and imaging using a delay line detector in time-of-flight photoemission microscopy

Oliver G. Schmidt, Horst Schmidt-Böcking, A. Oelsner, 2001 .