Pramodchandran N. Variyam

发表

Measuring code edges of ADCs using interpolation and its application to offset and gain error testing

Pramodchandran N. Variyam, Vinay Agrawal, 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

Low-cost and efficient digital-compatible BIST for analog circuits using pulse response sampling

Abhijit Chatterjee, Pramodchandran N. Variyam, Naveena Nagi, 1997, Proceedings. 15th IEEE VLSI Test Symposium (Cat. No.97TB100125).

Measuring stray capacitance on tester hardware

Abhijit Chatterjee, Pramodchandran N. Variyam, John Ridley, 2002, Proceedings 20th IEEE VLSI Test Symposium (VTS 2002).

DIBPro: Automatic Diagnostic Program Generation Tool

Bruce C. Kim, Pramodchandran N. Variyam, Venkat Kalyanaraman, 2006, 2006 IEEE International Test Conference.

Prediction of analog performance parameters using fast transienttesting

Abhijit Chatterjee, Pramodchandran N. Variyam, Sasikumar Cherubal, 2002, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Enhancing test effectiveness for analog circuits using synthesized measurements

Abhijit Chatterjee, Pramodchandran N. Variyam, A. Chatterjee, 1998, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).

FLYER: fast fault simulation of linear analog circuits using polynomial waveform and perturbed state representation

Abhijit Chatterjee, Pramodchandran N. Variyam, 1997, Proceedings Tenth International Conference on VLSI Design.

Hierarchical statistical inference model for specification based testing of analog circuits

Abhijit Chatterjee, Pramodchandran N. Variyam, Naveena Nagi, 1998, Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231).

Specification-driven test generation for analog circuits

Abhijit Chatterjee, Pramodchandran N. Variyam, A. Chatterjee, 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

Efficient test generation for transient testing of analog circuits using partial numerical simulation

Abhijit Chatterjee, Pramodchandran N. Variyam, Junwei Hou, 1999, Proceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146).

Specification-driven test design for analog circuits

Abhijit Chatterjee, Pramodchandran N. Variyam, 1998, Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223).

Production Realization of MTPR Test on Low-Cost ATE for OFDM Based Communication Devices

Abhijit Chatterjee, Pramodchandran N. Variyam, Ganesh Srinivasan, 2010, J. Electron. Test..

Digital built-in self test circuitry for phase-locked loop

Pramodchandran N. Variyam, Hari Balachandran, 2001 .

Increasing the IDDQ test resolution using current prediction

Pramodchandran N. Variyam, 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).

Test generation for comprehensive testing of linear analog circuits using transient response sampling

Pramodchandran N. Variyam, A. Chatterjee, 1997, ICCAD 1997.

Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling

Abhijit Chatterjee, Pramodchandran N. Variyam, 2000, IEEE Des. Test Comput..

Test generation for comprehensive testing of linear analog circuits using transient response sampling

Abhijit Chatterjee, Pramodchandran N. Variyam, 1997, 1997 Proceedings of IEEE International Conference on Computer Aided Design (ICCAD).

Accurate measurement of multi-tone power ratio (MTPR) of ADSL devices using low cost testers

Abhijit Chatterjee, C. P. Wang, Pramodchandran N. Variyam, 2005, European Test Symposium (ETS'05).

Test generation for analog circuits using partial numerical simulation

Abhijit Chatterjee, Pramodchandran N. Variyam, Junwei Hou, 1999, Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013).

Automatic diagnostic program generation for mixed signal load board

Bruce C. Kim, Pramodchandran N. Variyam, Kranthi K. Pinjala, 2003, International Test Conference, 2003. Proceedings. ITC 2003..