M. Natarajan Iyer

RF ESD protection strategies - the design and performance trade-off challenges

Dimitri Linten, Steven Thijs, Guido Groeseneken, 2005, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005..

Transient voltage overshoot in TLP testing — Real or artifact?

Philippe Roussel, Steven Thijs, Guido Groeseneken, 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium.

Significance of the failure criterion on transmission line pulse testing

Guido Groeseneken, M. Natarajan Iyer, Vesselin K. Vassilev, 2002, Microelectron. Reliab..

ESD-RF co-design methodology for the state of the art RF-CMOS blocks

Michiel Steyaert, Steven Thijs, Guido Groeseneken, 2005, Microelectron. Reliab..

Implementation of plug-and-play ESD protection in 5.5GHz 90nm RF CMOS LNAs - Concepts, constraints and solutions

Dimitri Linten, Steven Thijs, Guido Groeseneken, 2006, Microelectron. Reliab..

A CAD assisted design and optimisation methodology for over-voltage ESD protection circuits

Michiel Steyaert, Guido Groeseneken, J.-J. Yang, 2004, Microelectron. Reliab..

Low-power low-noise highly ESD robust LNA, and VCO design using above-IC inductors

Xiao Sun, Dimitri Linten, Steven Thijs, 2005, Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005..

High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices

Michiel Steyaert, Steven Thijs, Guido Groeseneken, 2003, Microelectron. Reliab..

A plug-and-play wideband RF circuit ESD protection methodology: T-diodes

Mirko Scholz, Dimitri Linten, Jonathan Borremans, 2009, Microelectron. Reliab..